top of page
ZL070128 Wafer Level Burn-In
  • ZL070128 Wafer Level Burn-In

    Wafer level burn-in system is designed to perform HTGB and/or HTRB burn-in and test for SiC/GaN wafer. The burn-in system can be widely used in research and development, mass production and quality monitoring, and can strictly screen chips with risks in advance to ensure the reliability of packaged products.

      Request for Quotation
      bottom of page